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Data Analysis

The wide range of advanced Data Analysis tools and features available with the 3MTS Maestro environment provide the power and efficiency for characterization test and production test groups using the 3MTS test system.

Built-in statistical data results to view overall Lot performance instantly, histogram and scatter plot features to analyze parametric spread or patterns across devices or dies of a Lot, advanced query filters to extract highly selective information from large Lot of test results, pulse plot displays to  visualize real time signal waveforms, tool to extract process capability (Cp, Cpk) parameters, optional waveform data analysis and processing tools, and many more. The host of tools for Data Analysis in the 3MTS test environment makes the test engineers' job easy as well as very effective.

The low cost 3MTS test platform provides attractive cost-performance benefits via excellent capabilities in tools, software and hardware.