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The
wide range of advanced Data Analysis tools and features available
with the 3MTS Maestro environment provide the power and efficiency
for characterization test and production test groups using the
3MTS test system.
Built-in
statistical data results to view overall Lot performance
instantly, histogram and scatter plot features to analyze parametric
spread or patterns across devices or dies of a Lot, advanced query
filters to extract highly selective information from large Lot of
test results, pulse plot displays to visualize real time
signal waveforms, tool to extract process capability (Cp, Cpk)
parameters, optional waveform data analysis and
processing tools, and many more. The host of tools for Data
Analysis in the 3MTS test environment makes the test engineers'
job easy as well as very effective.
The
low cost 3MTS test platform provides attractive cost-performance
benefits via excellent capabilities in tools, software and
hardware.
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