|
Å
|
|
angstrom
|
|
A/D
|
|
analog-to-digital
|
|
AC
|
|
alternating current
|
|
ACM
|
|
Association for Computing Machinery
|
|
ACS
|
|
a. Acceptance Criteria Specification
|
|
b. American computer Society
|
|
c. Adaptive computing system
|
|
ADC
|
|
analog-to-digital converter
|
|
ADSL
|
|
asymmetric digital subscriber line
|
|
AF
|
|
audio frequency
|
|
AFC
|
|
automatic frequency control
|
|
AI
|
|
artificial intelligence
|
|
AM
|
|
amplitude modulation
|
|
AMLCD
|
|
active-matrix liquid crystal display
|
|
ANSI
|
|
American National Standards Institute
|
|
APG
|
|
a. Algorithmic Pattern Generator.
|
|
b. Automatig program generator
|
|
API
|
|
a. Application Programming Interface.
|
|
b. A collection of C functions or C++ classes.
|
|
AQL
|
|
acceptance quality level
|
|
ASCII
|
|
American (National) Standard Code for
|
|
Information Interchange
|
|
ASIC
|
|
application-specific integrated circuit
|
|
ASQC
|
|
American Society of Quality Control
|
|
ATE
|
|
automatic test equipment
|
|
ATG
|
|
automatic test generation
|
|
ATM
|
|
asynchronous transfer mode
|
|
ATPG
|
|
automatic test program (or pattern) generator
|
|
BCD
|
|
binary-coded decimal
|
|
BER
|
|
bit error rate
|
|
BERT
|
|
bit error rate test
|
|
BGA
|
|
ball-grid array
|
|
BIOS
|
|
basic input-output system
|
|
BIST
|
|
built-in self-test
|
|
BIT
|
|
a. built-in test
|
|
b. Single Binary digit
|
|
BNC
|
|
bayonet-Neill-Concelman
|
|
BOM
|
|
Bill of Materials
|
|
BS
|
|
boundary scan
|
|
BSDL
|
|
Boundary-Scan Description Language
|
|
BSI
|
|
British Standards Institution
|
|
BYTE
|
|
a. 8 bits
|
|
b. built-in test equipment
|
|
CAD
|
|
computer-aided design
|
|
CAE
|
|
computer-aided engineering
|
|
CASE
|
|
computer-aided software engineering
|
|
CAE
|
|
computer-aided engineering
|
|
CASE
|
|
computer-aided software engineering
|
|
CAT
|
|
computer-aided test
|
|
CATC
|
|
Customer Acceptance Test Criteria
|
|
CCB
|
|
Change Control Board
|
|
CCD
|
|
charge-coupled device
|
|
chip
|
|
Jargon for a packaged device; a synonym for die.
|
|
CIIL
|
|
Common Instrument (or Control Intermediate)
|
|
Interface Language
|
|
CISC
|
|
complex instruction set computer
|
|
CLCC
|
|
ceramic leaded chip carrier
|
|
CM
|
|
Custom Modification
|
|
CMF
|
|
Common Mode Failure
|
|
CML
|
|
Current mode logic
|
|
CMOS
|
|
complementary metal-oxide semiconductor
|
|
CMRR
|
|
common-mode rejection ratio
|
|
CMV
|
|
common-mode voltage
|
|
CMVR
|
|
common-mode voltage ratio
|
|
COB
|
|
chip-on-board
|
|
CODEC
|
|
coder-decoder
|
|
CORBA
|
|
Common Object-Request Broaker Architecture
|
|
COTS
|
|
commercial off-the-shelf
|
|
CPLD
|
|
complex programable logic device
|
|
CPS
|
|
characters per second
|
|
cps
|
|
cycles per second
|
|
CPU
|
|
central processing unit
|
|
CR
|
|
Current Production
|
|
CRC
|
|
cyclic redundancy check
|
|
CS
|
|
a. Customer Service
|
|
b. Computer Science
|
|
CSA
|
|
Canadian Standards Association
|
|
CSMA/CA
|
|
carrier sense multiple access with collision
|
|
avoidance
|
|
CSMA/CD
|
|
carrier sense multiple access/collision detection
|
|
CV
|
|
constant voltage
|
|
CW
|
|
continuous wave
|
|
cycle time
|
|
The time duration from the start of one cycle to
|
|
the start of the next.
|
|
D/A
|
|
digital-to-analog
|
|
DAC
|
|
digital-to-analog converter
|
|
dB
|
|
decibel
|
|
dBa
|
|
decibels adjusted
|
|
dBm (psoph)
|
|
noise power in dBm measured by a set with
|
|
psophometric weighting
|
|
dBm V
|
|
dB referred to 1 millivolt across 75 ohms
|
|
DBPSK
|
|
differential-binary phase-shift keying
|
|
dBr
|
|
power difference in dB between any point
|
|
and a reference point
|
|
dBrn
|
|
dB above a reference noise
|
|
dBrnC
|
|
noise power in dBrn measured by a set with
|
|
C-message weighting
|
|
dBrnC0
|
|
noise power in dBrnC referred to or measured
|
|
at 0TLP
|
|
dBV
|
|
dB relative to 1 V (volt) peak-to-peak
|
|
dBW
|
|
dB referred to 1 W (watt)
|
|
dBx
|
|
dB above reference coupling
|
|
DC
|
|
direct current
|
|
DCA
|
|
direct chip attach
|
|
DCR
|
|
digital cellular service
|
|
DCT
|
|
discrete cosine transform
|
|
DDE
|
|
dynamic data exchange
|
|
DDS
|
|
direct digital synthesis
|
|
DECT
|
|
digital European cordless telecom
|
|
DES
|
|
Data Encryption Standard
|
|
DFM
|
|
design for manufacturability
|
|
DFS
|
|
Design For Serviceability
|
|
DFT
|
|
a. Design For Testability
|
|
b. Design for test
|
|
DG
|
|
Data generator.
|
|
DGPS
|
|
differential GPS
|
|
DIN
|
|
Deutsches Institut fur Normung
|
|
(German Institute for Standards)
|
|
DIP
|
|
dual in-line package
|
|
DL
|
|
a. Dual in-line
|
|
b. Defect level
|
|
DLL
|
|
a. Delay lock loop
|
|
b. dynamic link library
|
|
DMA
|
|
direct memory access
|
|
DMM
|
|
digital multimeter
|
|
DMT
|
|
Design Maturity Testing
|
|
DNL
|
|
differential nonlinearity
|
|
DNS
|
|
Domain Name System
|
|
DOS
|
|
disk operating system
|
|
DPM
|
|
a. Defects per Million
|
|
b. digital panel meter
|
|
DQPSK
|
|
differential-quadrature phase-shift keying
|
|
DRAM
|
|
dynamic random access memory
|
|
Driver
|
|
a. The circuitry that adds voltage levels to
|
|
input signals and applies the results to a DUT pin.
|
|
b. A software program intercating directly to
|
|
hardware
|
|
DSL
|
|
digital subscriber loop
|
|
DSO
|
|
digital sampling (or storage) oscilloscope
|
|
DSP
|
|
digital signal processor (or processing)
|
|
DUT
|
|
Device under test.
|
|
DVD
|
|
digital versatile disk
|
|
DVM
|
|
digital voltmeter
|
|
EBNF
|
|
Extended Backus - Naur Form
|
|
ECO
|
|
Engineering Change Order
|
|
ECR
|
|
a. Energy conservation ratio
|
|
b. Error Capture RAM.
|
|
EDA
|
|
electronic design automation
|
|
edge
|
|
An abrupt voltage or current change.
|
|
EDIF
|
|
Electronic Design Interchange Format
|
|
EDO
|
|
extended data out (RAM)
|
|
EDVT
|
|
Engineering Design Verification Testing
|
|
EEPROM
|
|
electrically erasable programmable read-only
|
|
memory
|
|
EFT
|
|
electrical fast transient
|
|
EIA/J
|
|
Electronic Industries Association
|
|
EISA
|
|
extended ISA (PC bus)
|
|
ELF
|
|
extremely low frequency (<3 kHz)
|
|
EMC
|
|
electromagnetic compatibility
|
|
EMF
|
|
electromagnetic field
|
|
emf
|
|
electromotive force
|
|
EMI
|
|
electromagnetic interference
|
|
EMP
|
|
electromagnetic pulse
|
|
EMR
|
|
electromagnetic radiation
|
|
EN
|
|
Norme Europ‚enne (European standard)
|
|
EOL
|
|
a. End of lot.
|
|
b. End of life
|
|
EOT
|
|
End of test.
|
|
EOW
|
|
End of wafer.
|
|
EPLD
|
|
erasable programmable logic device
|
|
EPP
|
|
enhanced parallel port
|
|
EPROM
|
|
erasable programmable read-only memory
|
|
ERP
|
|
a. Enterprise resource Planning
|
|
b. effective radiated power
|
|
ESD
|
|
electrostatic discharge
|
|
ESR
|
|
equivalent series resistance
|
|
ESS
|
|
environmental stress screening
|
|
ETS
|
|
equivalent time sampling
|
|
ETSI
|
|
European Telecommunications Standards
|
|
Institute
|
|
EU
|
|
European Union
|
|
EUT
|
|
equipment under test
|
|
eV
|
|
electron volt
|
|
F/V
|
|
frequency-to-voltage
|
|
FA
|
|
failure analysis
|
|
FC
|
|
fiber channel
|
|
FCC
|
|
Federal Communications Commission
|
|
FDDI
|
|
fiber distributed data interface
|
|
FDMA
|
|
frequency-division multiple access
|
|
FET
|
|
field-effect transistor
|
|
FFT
|
|
fast Fourier transform
|
|
FIFO
|
|
first-in, first-out
|
|
FIR
|
|
finite impulse response
|
|
FIT
|
|
fault isolation test
|
|
FM
|
|
frequency modulation
|
|
FMA
|
|
Failure mode analysis
|
|
FO
|
|
fiber-optic
|
|
FPGA
|
|
field-programmable gate array
|
|
FQFP
|
|
fine-pitch quad flat pack
|
|
FRU
|
|
Field Replaceable unit
|
|
FS
|
|
full scale
|
|
FSET
|
|
Format set.
|
|
FSK
|
|
frequency-shift keying
|
|
ftp
|
|
file transfer protocol
|
|
GFSK
|
|
Gaussian frequency-shift keying
|
|
gif
|
|
graphic image file
|
|
GMSK
|
|
Gaussian-filtered minimum-shift keying
|
|
GPIB
|
|
General Purpose Interface Bus; defined by
|
|
ANSI/IEEE 488 - 1978.
|
|
GPS
|
|
Global Positioning System (or Satellite)
|
|
GSM
|
|
Global System for Mobile Communications
|
|
(originally Groupe Spciale Mobile)
|
|
GUI
|
|
graphical user interface
|
|
HALT
|
|
highly accelerated life test
|
|
HASS
|
|
highly accelerated stress screening
|
|
HAST
|
|
highly accelerated stress test
|
|
HBM
|
|
human body model
|
|
HD
|
|
harmonic distortion
|
|
HDL
|
|
hardware description language
|
|
HDTV
|
|
high-definition television
|
|
HF
|
|
high frequency (3 MHz to 30 MHz)
|
|
hipot
|
|
high-potential
|
|
HPA
|
|
high-power amplifier
|
|
HTML
|
|
hypertext markup language
|
|
http
|
|
hypertext transfer protocol
|
|
HV
|
|
high voltage
|
|
Hz
|
|
hertz
|
|
I&E
|
|
Integration & Evaluation (Engineering)
|
|
I/O
|
|
input/output
|
|
IA
|
|
instrumentation amplifier
|
|
IC
|
|
integrated circuit
|
|
ICE
|
|
in-circuit emulator
|
|
ICT
|
|
In-Circuit Test
|
|
IDC
|
|
insulation displacement connector
|
|
IEC
|
|
International Electrotechnical Commission
|
|
IEE
|
|
Institution of Electrical Engineers (UK)
|
|
IEEE
|
|
Institute of Electrical and Electronics
|
|
Engineers
|
|
IES
|
|
Institute of Environmental Sciences
|
|
IF
|
|
intermediate frequency
|
|
IFT
|
|
inverse fast Fourier transform
|
|
IGBT
|
|
insulated (or isolated) gate bipolar transistor
|
|
IIR
|
|
infinite impulse response
|
|
IMAPS
|
|
International Microelectronics and
|
|
Packaging Society
|
|
IMD
|
|
intermodulation distortion
|
|
INL
|
|
integral nonlinearity
|
|
IPC
|
|
Institute for Interconnecting and Packaging
|
|
Electronic Circuits
|
|
IPS
|
|
Item Procurement Specification
|
|
IR
|
|
infrared radiation
|
|
IRQ
|
|
interrupt request
|
|
IS
|
|
Impact Statement
|
|
ISA
|
|
Instrument Society of America
|
|
ISDN
|
|
integrated services digital network
|
|
ISO
|
|
International Organization for Standardization
|
|
ISP
|
|
a. Internet service Provider
|
|
b. in-system programmable
|
|
ITS
|
|
Institute for Telecommunication Sciences
|
|
ITU
|
|
International Telecommunications Union
|
|
ITU-R
|
|
ITU radio communications unit
|
|
ITU-T
|
|
ITU telecommunications unit
|
|
JEDEC
|
|
Joint Electron Device Engineering Council
|
|
JIT
|
|
just in time
|
|
JPEG
|
|
Joint Photographic Experts Group
|
|
JTAG
|
|
Joint Test Action Group
|
|
KGD
|
|
known-good die
|
|
LAN
|
|
local area network
|
|
laser
|
|
light amplification by stimulated emission
|
|
of radiation
|
|
LAT
|
|
Local area transport, a proprietary Digital
|
|
Equipment Corp. (now Compaq) protocol
|
|
used to transfer data to and from Digital hosts
|
|
LCC
|
|
leadless chip carrier
|
|
LCD
|
|
liquid crystal display
|
|
LED
|
|
light-emitting diode
|
|
LF
|
|
a. low frequency (30 kHz to 300 kHz)
|
|
b. Line feed
|
|
LGA
|
|
land-grid array
|
|
LIF
|
|
low-insertion force
|
|
LNA
|
|
low-noise amplifier
|
|
LO
|
|
local oscillator
|
|
lot
|
|
(device production context) A group of
|
|
semiconductor devices, usually from the same
|
|
production run, treated as a unit.
|
|
LR
|
|
Last Supply, Current Production
|
|
LRU
|
|
line replaceable unit
|
|
LSB
|
|
least significant bit
|
|
LSET
|
|
Level set.
|
|
LSI
|
|
large-scale integration
|
|
LUT
|
|
look-up table
|
|
LV
|
|
Large vector memory. This refers to the
|
|
memory module when used in vector testing
|
|
mode.
|
|
LVM
|
|
Linear Vector Mode
|
|
Marcom
|
|
Marketing Communications Organization
|
|
mask
|
|
To set a comparator state used to ignore the
|
|
result of a comparison.
|
|
MATE
|
|
modular automatic test equipment
|
|
MCC
|
|
Microelectronics and Computer Technology
|
|
Corporation (formerly Microelectronics and
|
|
Computer Consortium)
|
