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Wafer Map Viewer

The 3MTS Wafer Map Viewer is a simple tool to enable the user to conveniently view the test results from a probed wafer lot of devices. 

The 16 bin color settings allow the results to be sorted and highlighted in appropriate colors, enabling the user analyze the probe results much better. The mouse pointer's tool-tip shows row, column and test result bin details of the corresponding die for quick information.